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WIRE BONDING IN
MICROELECTRONICS, 3/E: Materials, Processes,
Reliability, and Yield |
PRODUCT
DETAILS: Author: George
Harman Language: English Publisher: McGraw-Hill
Professional Publication Date: 1 Mar 2010 Dimensions: 16 x 3.5 x 23.6 cm Format: Hardcover Pages: 432 Condition: NEW Product_ID: AA71[zasłonięte]237
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The Industry Standard Guide to Wire Bonding--Fully
Updated The definitive resource on the critical process
of connecting semiconductors with their packages. Wire
Bonding in Microelectronics, Third Edition, has been
thoroughly revised to help you meet the challenges of
today's small-scale and fine-pitch microelectronics.
This authoritative guide covers every aspect of
designing, manufacturing, and evaluating wire bonds
engineered with cutting-edge techniques. In addition to
gaining a full grasp of bonding technology, you'll learn
how to create reliable bonds at exceedingly high yields,
test wire bonds, solve common bonding problems,
implement molecular cleaning methods, and much
more.COVERAGE INCLUDES: Ultrasonic bonding systems and
technologies, including high-frequency systems Bonding
wire metallurgy and characteristics, including copper
wire Wire bond testing Gold-aluminum intermetallic
compounds and other interface reactions Gold and
nickel-based bond pad plating materials and problems
Cleaning to improve bondability and reliability
Mechanical problems in wire bonding High-yield,
fine-pitch, specialized-looping, soft-substrate, and
extreme-temperature wire bonds Copper,
low-dielectric-constant (Cu/Lo-k) technology and
problems Wire bonding process modeling and simulation CD
includes all of the book's full-color figures plus
animations. |
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