SN74BCT8240ANT scan test device with octal buffers

11-10-2014, 21:48
Aukcja w czasie sprawdzania była zakończona.

Cena kup teraz: 98.40 zł

Użytkownik wolumen53_com

numer aukcji: 4599228471

Miejscowość Toruń

Koniec: 11-10-2014, 21:23

SN74BCT8240ANT

Texas Instruments

SDIP24
Scan test devices with octal inverting buffers

Members of the Texas Instruments SCOPE [tm] Family of Testability Products

Octal Test-Integrated Circuits

Functionally Equivalent to ’ F240 and ’ BCT240 in the Normal-Function Mode

Compatible With the IEEE Standard 1149.1-1990 JTAG Test Access Port and Boundary-Scan Architecture

Test Operation Synchronous to Test Access Port TAP

Implement Optional Test Reset Signal by Recognizing a Double-High-Level Voltage 10 V on TMS Pin

SCOPE & 63722 Instruction Set
– IEEE Standard 1149.1-1990 Required Instructions, Optional INTEST, CLAMP,and HIGHZ
– Parallel-Signature Analysis at Inputs
– Pseudo-Random Pattern Generation From Outputs
– Sample Inputs/Toggle Outputs

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